4330 IH       

    4330-IH is a sophisticated gravity tri-temp handler, and its large capacity chamber is suitable to environment measurement for Power device such as TO220, D-PAK, D2-PAK, DIP.

High UPH(8000pcs) is accomplished by integrating 8(Max) test units (when socket contactor used) with TO220 and D2PAK running. High temperature accuracy ±2℃ is also realized in the temperature range of Low temp(-50℃~0℃).


471 TTD4716 HBPC              The new 471-TT is a DC tester with a new concept that realizes simultaneous measurement of plural chips in the wafer process by utilizing measurement technology which we have been accumulating for many years. We have also succeeded to our high-voltage and current measurement technology as one of our advantages.  By measuring plural chips simultaneously, we can achieve a significant improvement in productivity compared to conventional testers.


4664 IH 3            The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes. 


4170 IH             We, Tesec is now introducing the new Map handler model 4170-IH that is for the direct test of the leadless QFN, CSP devices after dicing on the wafer.As the device tesrting is on the wafer ring, and devices positioning(x y z θ)compensation before testing by the visual check system, the high accuracy of the devices positioning informationand the suitable probe-pin contact pressure are maintained for the stable testing and high speed indexing.This new model is upgraded as a succeeding machine of the previous model 3270-IH that improved the transfer accuracy and increased the widthstand load of the test section table, also able to handle the WLCSP as well as comply to multi-testing site and simultaneous (parallel) testing.


4605 HTR              The 4605-HTR is the latest model of die sorting handler which dramatically improves the UPH as 30,000 from previous model 3905-HTR. The WLCSP requires high accuracy for vision inspection. Tesec prepares the latest vision system for the WLCSP.



    There are two types in LT4530 series according to requirement.


LT4530 is a state of the art model, which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequence contact requirements. Complete measures to prevent jamming and lead deformation enable high availability. This model is highly regarded by top users around the world because of its high throughput and high reliability.


Featuring 4 sites and high temperature testing. Thorough JAM countermeasure of LT9900 is taken over to LT4530 to achieve high throughput.


4218 HT             4218-HT handler enables high speed measurement and taping small signal devices. High UPH and production efficiency are ensured by using 2 sets of high speed revolving table. This handler also features z axis-less handling system which is patent pending, 2-step alignment unit for device stress-less. Integration of laser marking system and vision system brings you high quality output (taping).


4602 LV              There is a tendency that MOSFET has Low On Resistance so that it demands that Inductive Load Tester to have higher forcing current for measurement. The forcing current is limited by forcing voltage with previous test method. Thus it becomes difficult to test this kind of middle power range devices.
The 4602-LV has new test method (*VD-OFF mode & Time-Trip mode).
*VD-OFF mode : It is the mode to separate the VD power at Avalanche.
*Time-Trip mode : It turns off the devices after specified time from forcing current.  
Thus it can correspond with high current measurement. In addition, it is able to test wide range of devices by expanding the forcing voltage as 300V and forcing current as 200A.


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