We, Tesec is now introducing the new strip frame testing handler model 4380 that is for ambient and hot temperature testing without singular the SOIC devices attachedin matrix format on the strip frame.The device positions(x y z θ) are compensated before testing by visual alignment function, so that high accuracy of the device positioning and probe-pin contactor pressure for all of the devices are maintained as firm for stable testing and high indexing.


            We, Tesec is now introducing the new Map handler model 4170-IH that is for the direct test of the leadless QFN, CSP devices after dicing on the wafer.As the device tesrting is on the wafer ring, and devices positioning(x y z θ)compensation before testing by the visual check system, the high accuracy of the devices positioning informationand the suitable probe-pin contact pressure are maintained for the stable testing and high speed indexing.This new model is upgraded as a succeeding machine of the previous model 3270-IH that improved the transfer accuracy and increased the widthstand load of the test section table, also able to handle the WLCSP as well as comply to multi-testing site and simultaneous (parallel) testing.


           3905-HTR is a MAP Sorter which picks up devices from wafer ring and sorts to tape, tube or bin according to the MAP file created by 4170-IH.

     3905-HTR is a high speed handling system, available for 12 inches wafer rings. When used in combination with 4170-IH, 3905-HTR much improves efficiency in testing process of leadless devices as a high speed sorting machine.


            4218-HT handler enables high speed measurement and taping small signal devices. High UPH and production efficiency are ensured by using 2 sets of high speed revolving table. This handler also features z axis-less handling system which is patent pending, 2-step alignment unit for device stress-less. Integration of laser marking system and vision system brings you high quality output (taping).


             The gravity-feed LT9900 handler series is a state-of -the-art model,which features a high throughput capability, eight sites, and high and low temperature measurements, and meets all high-frequency contact requirements. Complete measures to prevent jamming and lead deformation enable high availability.  The LT 9900 is highly regarded by top users around the world because of its high throughput and high reliability.


           The 881-TT/A is a high performance test system which covers wide range of discrete semiconductor devices from small signal devices to power devices. As the most popular tester in the world corresponding to the steady progress of semiconductor devices in specifications and performance.